In situ measurement of lithiation-induced stress in silicon nanoparticles using micro-Raman spectroscopy

نویسندگان

  • Zhidan Zeng
  • Nian Liu
  • Qiaoshi Zeng
  • Seok Woo Lee
  • Wendy L. Mao
  • Yi Cui
چکیده

Department of Geological Sciences, Stanford University, Stanford, CA 94305, USA Center for High Pressure Science and Technology Advanced Research (HPSTAR), Shanghai 201203, PR China HPSynC, Geophysical Laboratory, Carnegie Institution of Washington, Argonne, IL 60439, USA Department of Materials Science and Engineering, Stanford University, Stanford, CA 94305, USA Photon Science and Stanford Institute for Materials and Energy Sciences, SLAC National Accelerator Laboratory, Menlo Park, CA 94025, USA

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تاریخ انتشار 2016